The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2003

Filed:

Sep. 24, 2002
Applicant:
Inventors:

Yuriy N. Pchelnikov, Cary, NC (US);

David S. Nyce, Apex, NC (US);

Assignee:

MTS Systems Corporation, Eden Prairie, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/300 ;
U.S. Cl.
CPC ...
G01N 3/300 ;
Abstract

A method and apparatus for monitoring one or more parameters of a variable physical structure, such as liquid level, is disclosed. The method and apparatus includes an electrodynamic element placed in proximity to a monitored structure and exciting within said element an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field penetrates into the monitored structure and then variations of the electromagnetic field parameters are measured for the element caused by a variation in the structure. The exciting of the electrodynamic element is by an electromagnetic field in the form of at least one slowed electromagnetic wave having suitable energy distribution of the electric and magnetic fields for the measuring of the electromagnetic field parameters.


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