The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2003

Filed:

May. 11, 2000
Applicant:
Inventor:

Masao Shigyo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 9/00 ;
U.S. Cl.
CPC ...
G01L 9/00 ;
Abstract

A method for measuring a pressure between a pair of pressing surfaces in point or linear contact with each other by utilizing a pressure measuring film which causes a pressurized portion thereof to develop a color in proportion with the pressure applied. An elastic sheet is disposed between the pressing surface having the point/linear contact portion and the pressure measuring film so as to decrease the pressure transmitted and applied to the pressure measuring film. The pressure distribution obtained from the colored image formed on the pressure measuring film is used to determine the actual maximum pressure applied between the pressing surfaces. It is possible to measure the large pressure which falls in or exceeds the measurable pressure range of the pressure measuring film.


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Shigyo, Masao. (2003). Method for measuring pressure higher than measurable range of pressure measuring film (U.S. Patent No. 6564641). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6564641

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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