The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
Nov. 08, 1999
Chi Duy Bui, Austin, TX (US);
T. W. Griffith, Jr., Cedar Park, TX (US);
Manoj Kumar, Santa Clara, CA (US);
Terry Lee Leasure, Georgetown, TX (US);
Philip George Shephard, III, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Each match word line driver circuit associated with a content addressable memory (CAM) utilizes a scannable latch for testing. The scannable latches associated with a particular CAM are connected together, scan output of one to scan input of the next, forming a scanning latch chain. In test mode the scannable dynamic latch is used either for testing CAM match circuits or for driving word lines to test the RAM array. Testing CAM match circuits is accomplished by patterning the CAM array with known storage values. The match circuitry then compares an effective address to each storage value and the results are scanned out. Testing the RAM array is performed by driving each word line with a known scan value. Each word line responds the scan value and a sense amplifier outputs a RAM array value based on the word line.