The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
Dec. 20, 2000
Applicant:
Inventor:
Georg Schmitz, Roetgen, DE;
Assignee:
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 3/00 ;
U.S. Cl.
CPC ...
G21K 3/00 ;
Abstract
The invention relates to an X-ray examination apparatus which includes an X-ray source, an X-ray detector, absorption means arranged between the X-ray source and the X-ray detector, a control unit for adjusting the absorption degree of the absorption means, an image processing unit and a display unit. In order to perform an automatic adjustment of the absorption means, the absorption degree therein is optimized in dependence on user-specific parameters ( ) and/or apparatus-specific parameters ( ) and/or structure parameters ( ) and/or parameters ( ) classifying the subject matter of the image.