The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2003

Filed:

Jun. 01, 2000
Applicant:
Inventor:

Doron Rainish, Ramat Gan, IL;

Assignee:

D.S.P.C. Technologies Ltd., Petach Tikva, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/04 ;
U.S. Cl.
CPC ...
H04L 7/04 ;
Abstract

Apparatus for providing an optimized sampling phase to a received signal in a given channel, the received signal including inter-symbol interference. The apparatus includes a voltage controlled clock (VCC) for providing a VCC sampling phase, a first signal detector, connected to the VCC, for sampling the signal according to an advanced sampling phase which is advanced by a predetermined value &dgr; with respect to the VCC sampling phase, thereby producing a first sampled signal, a second signal detector, connected to the VCC, for sampling the signal according to a delayed sampling phase which is delayed by a predetermined value &dgr; with respect to the VCC sampling phase, thereby producing a second sampled signal, a first channel metric estimating unit, connected to the first signal detector, for obtaining a first estimated metric value from the first sampled signal, a second channel metric estimating unit, connected to the second signal detector, for obtaining a second estimated metric value from the second sampled signal and a subtracting unit, connected to the first channel estimating unit and to the second channel estimating unit, for subtracting the second first estimated metric value from the second estimated metric value, thereby obtaining a phase correction signal according to which, the VCC sampling phase is to be corrected.


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