The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2003

Filed:

Dec. 29, 2000
Applicant:
Inventor:

Yuejian Wu, Kanata, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 7/00 ;
Abstract

A technique for testing a static random access memory comprising at least the first port and a second port is disclosed. In one embodiment, the technique may be realized by testing the memory with values through the first port while applying one of a shadow write and a shadow read from the second port and testing the memory through the second port while applying one of the shadow write and the shadow read from the first port. The shadow write may be designed to write specified values into cells of the memory not being tested where the specified values are opposite to values used in testing the memory. The shadow read may be designed to read values from memory that are opposite to the values used in testing the memory.


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Wu, Yuejian. (2003). System and method for testing tdm srams (U.S. Patent No. 6563751). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6563751

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