The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
Sep. 13, 2001
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A microscope according to the invention comprises an aberration correcting objective lens facing a specimen and having an aberration correcting lens correcting an aberration due to an error in the thickness of a cover, a Petri dish or a slide glass; a moving amount detector detecting moving amount of the aberration correcting lens; a focusing unit moving the specimen; a driver unit driving the focusing unit; and an arithmetic unit obtaining a defocus amount based on a moving amount detected by the moving amount detector. When the aberration correcting lens is moved, the specimen is put out of focus. On the basis of a defocus amount obtained by the arithmetic unit, the driver unit drives the focusing unit so that the lens may focus on the specimen.