The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
Aug. 22, 2001
Douglas Michael Hannan, Cumberland, ME (US);
National Semiconductor Corporation, Santa Clara, CA (US);
Abstract
The present invention relates to an apparatus and a method for detecting an open circuit fault condition in a differential signal, and generating a fault detection signal. An open circuit fault condition is detected by employing weak current sources to pull the differential signal paths outside the valid ac common-mode range and toward the supply rails. If both signal paths can be pulled within a predetermined proximity to the supply rails by their respective weak current sources, an open condition fault is defined to exist and a fault detection signal is generated. The fault detection signal can be used by another device to report the fault condition.