The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
Sep. 28, 2001
James S. Kachelries, Wallingford, PA (US);
Louis R. Truckley, Oxford, PA (US);
Douglas P. Knapp, Devon, PA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method and apparatus for non-destructively measuring the depth of a crack with precision and accuracy in a workpiece using an eddy current process. The method involves empirically creating a response curve of the eddy current response produced from crack(s) in a sample workpiece(s), wherein the depth of the crack(s) in the sample workpiece(s) may be modified a plurality of times and an eddy current response reading is taken at each different crack depth. The response curve is then used to interpolate the depth of a crack in a workpiece composed of the same material non-destructively by measuring the eddy current response in the workpiece crack and then obtaining the predetermined crack depth value form the response curve.