The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
Aug. 22, 2000
Applicant:
Inventor:
Bruno Knobel, Laufen, CH;
Assignee:
Zwick GmbH & Co, Ulm, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/186 ;
U.S. Cl.
CPC ...
G01N 2/186 ;
Abstract
The invention relates to a method for measuring the deformation of a specimen without contact with the specimen. The surface of the measured specimen is partly illuminated by a laser light having uniform intensity. A speckle image is produced due to the local quality of the surface and is reproduced via an optical image sent onto a light-sensitive sensor. At least one reference speckle is selected by an evaluator unit from the totality of the speckles of the speckle image. The displacement of the reference speckle on the sensor is evaluated as the measure of the change that occurred in the specimen. In addition, the invention provides a device for performing this method.