The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
Jul. 27, 2000
Evangelos Zoidis, Waiblingen, DE;
Sony International (Europe) GmbH, Berlin, DE;
Abstract
The present invention relates to a method for identification of plastic materials of interest by optical measurements, preferably spectroscopic measurements, comprising the steps of measuring a sample and providing a sample spectrum, providing reference spectra for a given group of reference materials of interest, determining spectral distances between sample spectrum and reference spectra, material identification by associating the sample to the material having the reference spectrum with the smallest spectral distance to the sample spectrum. In this method at least one identification frequency range having a high absolute deviation ratio D and/or a high smoothed deviation ratio D′ between all pairs of possible plastic materials of interest is determined, and that said spectral distance is only determined within said at least one identification frequency range.