The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
May. 04, 2000
Applicant:
Inventors:
Thomas Amann, Maeder, AT;
Jurij Sterban, Heerbrugg, CH;
Ruedi Rottermann, Berneck, CH;
Peter Soppelsa, Balgach, CH;
Heinz Zimmermann, Balgach, CH;
Assignee:
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 7/02 ;
U.S. Cl.
CPC ...
G02B 7/02 ;
Abstract
The invention relates to a novel type of microscope with an illuminating beam which is guided through the magnification power changer with optimized light intensity parallel to the observation beam. The invention specifically relates to a stereo fluorescence microscope comprising a set of quickly replaceable filters in interchangeable filter carriers. The novel design offers good light efficiency on the object. Malfunctions occurring as a result of intrinsic reflections or fluorescence phenomena inside the microscope are avoided.