The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2003

Filed:

Aug. 10, 2001
Applicant:
Inventors:

Shigeharu Kimura, Tokyo, JP;

Takeshi Shimano, Tokorozawa, JP;

Tetsuo Ariyoshi, Kokubunji, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/740 ;
U.S. Cl.
CPC ...
G02B 2/740 ;
Abstract

To reduce an effect of reflected light from a layer (or layers) other than a layer to be read upon focus position control when reading a multilayer optical disk in an optical disk drive. In an optical system where a focus error signal is generated by the knife edge method, a photodetector that is divided into four parts is used. Each of two pairs of light detecting elements on the right or left side are formed by division of a detection plane of the photodetector such that the reflected light from a neighboring layer falls half-and-half on that pair of the light detecting elements. Signals from the photodetector are given with alternating polarities in such a way that any adjacent light detecting elements have mutually different polarities and are added up together to form the focus error signal.


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