The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2003

Filed:

May. 23, 2001
Applicant:
Inventor:

David Thomas, Bartlett, TN (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract

A method and apparatus for improving the resolution of fundus images and correction of optical aberrations is described in which a bundle of electromagnetic beams is directed into an optical system and the reflected electromagnetic beams are recorded by a sensor. A processor may control the energy source to provide a plurality of different electromagnetic bundles to image the entire optical system. The reflected electromagnetic beams recorded by the sensor are compared to the original electromagnetic bundle configurations to calculate the aberrations of the optical system of interest. Among other applications, the calculated aberrations may be used to construct accurate fundus images, provide input for laser surgery of the eye, fabricate corrective lenses and provide accurate digital images of structures sensed through imperfect optical systems.


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