The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2003
Filed:
Apr. 23, 2001
Hiroyuki Uramachi, Tokyo, JP;
Fumiyoshi Yonezawa, Tokyo, JP;
Naruki Suetake, Tokyo, JP;
Ryuji Tohyama, Tokyo, JP;
Tomoya Yamakawa, Tokyo, JP;
Shingo Hamada, Tokyo, JP;
Takeharu Oshima, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A flow rate-measuring device capable of measuring accurately a flow rate of fluid to be measured containing a drift or eddy as compared with a conventional device is provided. A flow rate-measuring passage for measuring a flow rate of the fluid to be measured is constructed so that its opening area in an upstream region communicating to an inlet gradually decreases from upstream to downstream. A flow rate-detecting element is disposed near an outlet in the flow rate-measuring passage The device is provided with a leak flow passage allowing a part of the fluid which has flown in from the inlet of the flow rate-measuring passage to leak out of the flow rate-measuring passage at a portion upstream from an outlet of the flow rate-measuring passage in particular upstream from a position where the flow rate-detecting element is disposed.