The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2003

Filed:

Aug. 03, 2001
Applicant:
Inventors:

Wilfried Daehn, Celle, DE;

Erwin Hammerl, Zangberg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 2/900 ;
U.S. Cl.
CPC ...
G11C 2/900 ;
Abstract

In a method for checking the functioning of memory cells of an integrated semiconductor memory, a first group of the memory cells is tested. The test results, separately for each tested memory cell, are buffer-stored in at least triple copies in a second group of the memory cells. A comparison is made between the copies of each of the test results and the evaluation thereof. The addresses of the respective memory cells of the second group are determined by an address transformation. The latter is configured in such a way that significant clusters of functional errors in an error-affected second group of the memory cells do not influence the result of the test method.


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