The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2003

Filed:

Mar. 09, 2001
Applicant:
Inventors:

Alan Stirling Campbell, Lexington, KY (US);

Gary Allen Denton, Lexington, KY (US);

Stanley Coy Tungate, Jr., Lexington, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 1/500 ;
U.S. Cl.
CPC ...
G03G 1/500 ;
Abstract

A method of calibrating a multi-color electrophotographic machine having an image bearing surface includes forming toner patches of cyan, magenta, and yellow solid areas individually and in superimposed combination to form a series of single layer and multi-layer test patches. Light is emitted onto these single and multi-layer test patches. The amount of light that is reflected off of each test patch is measured. Light is also emitted onto a bare section of the image-bearing surface. The bare section has substantially no toner thereon. An amount of light that is reflected off of the bare section is measured. The step of measuring an amount of light reflected off single layer solid area test patches is repeated for a series of laser power and developer bias conditions. A laser power and/or a developer bias is adjusted dependent upon each of the three measuring steps.


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