The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Sep. 10, 2001
Sadashi Adachi, Hachioji, JP;
Atsushi Yonetani, Tama, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
Microscope apparatus and a method are disclosed for avoiding a reduction in intensity at the periphery of a microscope image that is detected by an electronic image-detector and then displayed. The method includes inserting one or more stops along the optical axis of the microscope, said stop(s) having a central transmissive region and a blocking region outside the central transmissive region; and positioning at least one stop so as to simultaneously block peripheral portions of axial and abaxial light fluxes from a sample under observation from being incident onto the electronic image detector, thereby making the axial and abaxial light fluxes that are incident onto the electronic image detector substantially equal in detected brightness. The apparatus disclosed is for implementing the method, and includes a relay optical system, a middle barrel of a microscope, and one or more stops as described above which simultaneously block peripheral portions of axial and abaxial light fluxes from a sample under observation from being passed by the middle barrel.