The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Dec. 01, 2000
Yuji Takata, Fukuoka, JP;
Hideaki Matsuo, Fukuoka, JP;
Kazuyuki Imagawa, Fukuoka, JP;
Takeshi Ohashi, Fukuoka, JP;
Matsushita Electric Industrial Co., LTD, Osaka, JP;
Abstract
A 3D shape measurement method and a device using the method eliminate harmful influences of periodic inconstancy in the phase shift method. Optical intensity patterns following periodic functions of sine waves are irradiated on an object while shifting the phases thereof. Based on the image picked up from the object, the 3D shape of the object is measured. In this method, a plurality of optical intensity patterns following periodic functions with varying wavelengths are projected onto the object so as not to interfere with each other. The least common multiple of the wavelengths of the periodic functions is larger than the extent having periodic inconstancy within the image pickup area.