The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2003

Filed:

Jun. 30, 1999
Applicant:
Inventor:

Conrad Stenton, Midland, CA;

Assignee:

Raytheon Company, Lexington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

A structure ( ) is located relative to a reference surface ( ) using an optical target ( ) affixed to the structure ( ) and having a reflective angular-reference hologram ( ) thereon with an effective angular orientation. An alignment light beam ( ) is directed perpendicular to the reference surface ( ) and incident upon the angular-reference hologram ( ) on the optical target ( ), and a signal return of the alignment light beam ( ) is received at a measurement location. The angular orientation of the structure ( ) is adjusted to achieve a signal return of the alignment light beam ( ) corresponding to an alignment of the alignment light beam ( ) to the effective angular orientation of the reflective angular-reference hologram ( ). Multiple reflective angular-reference holograms ( ) may be spatially superimposed upon each other in the optical target ( ) or spatially separated from each other on the optical target ( ).


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