The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Oct. 15, 2001
Andrew Davidson, Mountain View, CA (US);
Jan-Willem Pieterse, San Jose, CA (US);
New Focus, Inc., San Jose, CA (US);
Abstract
A method and apparatus for minimizing the effects of noise when measuring a response of a device under test to laser light. Laser light provided from a laser source is provided to an interferometer, which splits the source laser light into a first laser light portion and a second laser light portion and then interferometrically combines the first laser light and the second laser light, resulting in a time-varying interference modulated test laser light and a time-varying interference modulated reference laser light. The time-varying interference modulated test laser light is propagated to a device under test so as to cause the device under test to propagate responsive time-varying interference modulated test laser light. The responsive time-varying interference modulated test laser light is converted to an responsive amplitude modulated electrical test signal, which is high pass filtered. The high pass filtered signal is then demodulated so as to produce a time-varying electrical signal that represents the responsive time-varying interference modulated test laser light propagated by the device under test in response to the time varying interference modulated test laser light.