The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Dec. 27, 2000
Applicant:
Inventor:
Yoichi Fujiyama, Nara, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/10 ;
U.S. Cl.
CPC ...
G01N 1/10 ;
Abstract
A measuring cell is formed of base plates joined together. A passage groove is formed on a joining surface of one base plate. Through-holes for introducing and discharging a fluid sample are formed on the other base plate, and the joining surface is provided with an optically opaque Si film as slits. Further, the joining surfaces of the base plates and the inner surface of the passage groove are covered with SiO films. Thus, a measuring cell having a sufficiently small passage sectional area, a high air-tightness, a chemically stable measuring chamber, and a high measuring sensitivity can be obtained.