The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Apr. 08, 2002
Applicant:
Inventor:
Mats Lundqvist, Täby, SE;
Assignee:
Mamea Imaging AB, Täby, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 ;
U.S. Cl.
CPC ...
G01T 1/24 ;
Abstract
The present invention relates a method of enhancing contrast information from an x-ray detecting arrangement, when detecting a number of photons in said arrangement comprising at least two adjacently arranged sensors provided on one substrate, each sensor having a corresponding output signal, each of which can be influenced due to shared charge from a photon detected in one of said adjacent sensors, which detected photon indirectly creates an amount of free charges proportional to the photon energy, wherein said influence on said signal is considered by weighting said photon with respect to possible said photon charge-share between said at least two adjacent sensors.