The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Jul. 01, 1999
Applicant:
Inventors:
John Wallace Parce, Palo Alto, CA (US);
Anne R. Kopf-Sill, Portola Valley, CA (US);
Luc J. Bousse, Menlo Park, CA (US);
Assignee:
Caliper Technologies Corp., Mountain View, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/3558 ;
U.S. Cl.
CPC ...
G01N 3/3558 ;
Abstract
The present invention provides novel microfluidic devices and methods that are useful for performing high-throughput screening assays. In particular, the devices and methods of the invention are useful in screening large numbers of different compounds for their effects on a variety of chemical, and preferably, biochemical systems.
Parce, John. (2003). High throughput screening assay systems in microscale fluidic devices (U.S. Patent No. 6558944). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6558944
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile