The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Jul. 06, 2000
Brian L. Ganz, Carlsbad, CA (US);
Mandel W. Mickley, Oceanside, CA (US);
John Andrew Moulds, Encinitas, CA (US);
Christopher T. Brovold, Carlsbad, CA (US);
RoboDesign International, Inc., Carlsbad, CA (US);
Abstract
A microarrayer for spotting solution onto slides in an automated microarray dispensing device. Elements of the present invention include: at least one dispense head for spotting the slides, at least one light source capable of illuminating the slides, at least one camera operating in conjunction with the at least one light source. The at least one camera is capable of acquiring and transmitting slide image data to a computer. The computer is programmed to receive the slide image data and analyze it. The computer will then generate post analysis data based on the analysis of the slide image data. The post analysis data is available for improving the spotting of the solution onto the slides. In a preferred embodiment, the slide image data includes information relating to slide alignment, information relating to spot quality, and slide identification information. In a preferred embodiment, the analysis of the information relating to slide alignment enables the computer to make automatic adjustments to the relative positions of the at least one dispense head and the slides to increase the accuracy of the spotting. In a preferred embodiment, the analysis of the information relating to spot quality identifies a spot as pass or fail. An operator is then able to rework the spot. In a preferred embodiment, the analysis of the slide identification information enables the computer to track each slide.