The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2003

Filed:

Mar. 28, 2000
Applicant:
Inventors:

Akira Mitsumaru, Tokyo, JP;

Kazumi Kato, Tokyo, JP;

Kazuhiro Itabashi, Tokyo, JP;

Toshiyuki Kakinoki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21C 2/300 ; B21K 5/20 ;
U.S. Cl.
CPC ...
B21C 2/300 ; B21K 5/20 ;
Abstract

A method of determining at least one dimension of an extrusion die includes determining a plurality of reference points on a contour of an opening of the extrusion die. Sizes of a plurality of figures with same shapes corresponding to the plurality of reference points are determined. Each of the plurality of figures is inscribed in the contour of the opening and has at least one axis of symmetry. Each of the plurality of figures contacts each of the plurality of reference points and at least one another point on the contour. The at least one dimension of the extrusion die is determined based on the sizes of the plurality of figures.


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