The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Mar. 31, 2000
Applicant:
Inventors:
Ruben Michel, Hopkinton, MA (US);
Tao Kai Lam, Boston, MA (US);
David W. Desroches, Methuen, MA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/200 ;
U.S. Cl.
CPC ...
G06F 1/200 ;
Abstract
A method checks a swap's quality. The method includes finding an upper bound for reductions to a disk's seek time or total access time. The reductions are caused by swapping single storage volumes of the disk, which is in a preselected state, with an external storage volume. The method also includes finding a reduction to the seek time or total access time produced by swapping one storage volume of the disk with a selected external storage volume and comparing the found reduction to the upper bound.