The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Sep. 15, 2000
James R. Braig, Alameda, CA (US);
Charles E. Kramer, Poway, CA (US);
Bernhard B. Sterling, Danville, CA (US);
Daniel S. Goldberger, Boulder, CO (US);
Peng Zheng, Alameda, CA (US);
Arthur M. Shulenberger, Brisbane, CA (US);
Rick Trebino, Atlanta, GA (US);
Richard A. King, Berkeley, CA (US);
Casper W. Barnes, Murrieta, CA (US);
Optiscan Biomedical Corporation, Alameda, CA (US);
Abstract
A method of determining the analyte concentration of a test sample is described. A temperature gradient is introduced in the test sample and infrared radiation detectors measure radiation at selected analyte absorbance peak and reference wavelengths. Reference and analytical signals are detected. In the presence of the selected analyte, parameter differences between reference and analytical signals are detectable. These parameter differences, having a relationship to analyte concentration, are measured, correlated, and processed to determine analyte concentration in the test sample. Accuracy is enhanced by inducing a periodically modulated temperature gradient in the test sample. The analytical and reference signals may be measured continuously and the parameter difference integrated over the measurement period to determine analyte concentration.