The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Jan. 18, 2000
Yong-Woo Lee, Seoul, KR;
Woo-Hyuk Jang, Kyonggi-do, KR;
Hyung-Jae Lee, Kyonggi-do, KR;
Tae-Hyung Rhee, Kyonggi-do, KR;
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
Disclosed are an apparatus for and a method of measuring optical alignment conditions of optical fibers mounted to a V-groove array in an optical fiber block connected to the input or output terminals of an optical waveguide device. The disclosed apparatus includes a light source, a measuring unit for measuring the characteristics of a light emitted from the light source and outputted from each of the optical fibers after passing through the optical fiber, and a control unit for determining respective central positions of the first and last ones of the optical fibers, based on the characteristics of the first and last optical fibers measured by the measuring unit, determining a direction connecting the determined central positions of the first and last optical fibers, and conducting a control for allowing the light emitted from the light source to be irradiated onto the remaining optical fibers in a sequential fashion along the determined direction, thereby allowing the measuring unit to measure the characteristics of the remaining optical fibers.