The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2003

Filed:

Sep. 10, 1999
Applicant:
Inventors:

Toshio Norita, Osaka, JP;

Hiroshi Uchino, Kyoto, JP;

Eiichi Ide, Itami, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/124 ;
Abstract

A method and apparatus for inputting three-dimensional data are provided, in which operation for obtaining incident angles is not required and accuracy of three-dimensional data can be improved. The method includes steps of irradiating a reference light beam from a first starting point A to an object by a first angle &thgr;A, irradiating a reference light beam from a second starting point B separated from the first starting point A to the object by a second angle &thgr;B, moving the first and the second starting points A, B in one direction so as to perform sub scanning of an imaginary plane VS, detecting time points TA, TB when the reference light beam reflected by the object Q passes each sampling section of the imaginary plane; and calculating the position of the object for each sampling section in accordance with positions of the first and second starting points A, B in each of the detected time points TA, TB and first and second angles &thgr;A, &thgr;B.


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