The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Jan. 29, 2001
Erland Leide, Helsingborg, SE;
Nils Wihlborg, Helsingborg, SE;
Håkan Wedelsb{haeck over (a)}ck, Ängelholm, SE;
Tomas Jonasson, Helsingborg, SE;
Roger Ylikangas, Rydebäck, SE;
Foss Tecator AB, Hoganas, SE;
Abstract
A method and device for optical measuring of small particles for analysis of the quality of the particles. A sample-feeding carrier is adapted to take up particle samples in sample holders and transport the particle samples to a place for optical measurement. A mirror-supporting means follows the movement of the carrier and has mirrors matching the sample holders. A device illuminates a particle sample when positioned for optical measurement and a detector, which is sensitive to electromagnetic radiation, records a result of optical measurement of the illuminated particle sample. A mirror reflects the particle sample, so that a mirror image thereof stands essentially still seen from the detector, when a measurement is being recorded, owing to the fact that the mirror image of the particle sample falls on a center axis of the movement of the mirror-supporting means.