The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2003

Filed:

Feb. 19, 2002
Applicant:
Inventors:

James Fredrick Searcy, Carmel, IN (US);

David Leo Hart, Westfield, IN (US);

Stephen William Alland, Newbury Park, CA (US);

Assignee:

Delphi Technologies, Inc., Troy, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/40 ;
U.S. Cl.
CPC ...
G01S 7/40 ;
Abstract

A method of measuring elevational misalignment of an automotive radar sensor in a factory or service setting utilizes two or more targets that can be discriminated by the radar system. The targets are positioned at different elevational angles with respect to the desired elevation axis, and the degree of elevational misalignment is determined according to the ratio or difference in return signal amplitude for the two targets. Discrimination of the targets may be ensured by differences in range, azimuth angle or Doppler. Since the amplitude difference is a measure of misalignment, the measurement may be used to verify proper alignment or to indicate the amount of adjustment required to achieve proper alignment.


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