The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Aug. 02, 2001
Junya Shiraishi, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
In a semiconductor integrated circuit, a test controller generates test patterns for all of the pins of a core logic from test patterns for only the pins necessary for the test. The test controller receives information on pins to be tested and first input test patterns including input values and output expectation values for the pins to be tested. The test controller sets the input values or output expectation values of pins which are not to be tested to predetermined values and generates a second input test pattern in which the input values or output expectation values of all the pins are set. The second input pattern is provided to the core logic. An output test pattern is obtained in exactly the reverse order.