The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2003

Filed:

Jun. 27, 2001
Applicant:
Inventor:

Kei Nishioka, Kyoto, JP;

Assignee:

Rohm Co., Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract

A semiconductor integrated circuit device (IC) incorporates an array Dch of measurement elements D -Dm in the form of buffers for example connected in series. These elements represent standard internal elements of the IC The array Dch is supplied with a signal in synchronism with a fast clock signal CLK of the IC The propagation speed of the signal is given in terms of the number of the measurement elements through which the propagation signal has passed in one clock interval. This can be done by simply supplying the IC with a test signal GO and a reset signal RES as the instruction signals from an external tester. A tester slower in the operating frequency than the IC can be used to measure the propagation speed of the IC


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