The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2003

Filed:

Jun. 13, 2001
Applicant:
Inventors:

Johan Samuel Van Den Brink, Eindhoven, NL;

Julius Simon Cohen, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A magnetic resonance imaging system is provided with a system of emission antennas,: for example, emission coils, for generating RF excitation pulses. The RF excitation pulses generate magnetic resonance signals from an object to be examined. The system of emission antennas has a spatially inhomogeneous emission profile. The inhomogeneous emission profile is used for the partial spatial encoding of the magnetic resonance signals in addition to the encoding on the basis of magnetic gradient fields. The magnetic resonance image is reconstructed on the basis of the inhomogeneous emission profile


Find Patent Forward Citations

Van Den Brink, Johan. (2003). Magnetic resonance imaging method involving sub-sampling (U.S. Patent No. 6556010). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6556010

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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