The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Jul. 27, 2000
Evangelos Zoidis, Waiblingen, DE;
Sony International (Europe) GmbH, Berlin, DE;
Abstract
Method for identification of plastic materials of interest by spectroscopic measurements, comprising the steps of measuring a sample and providing a sample spectrum; providing reference spectra for a given group of reference materials of interest, determining spectral distances between sample spectrum and reference spectra, material identification by associating the sample to the material having the reference spectrum with the smallest spectral distance to the sample spectrum. In this method a multi-level measurement is conducted, wherein in each level the number of possible materials is further limited. In a first level at least 2 sub-groups and in all levels starting with a second level at least one sub-group of possible materials are defined, wherein one sub-group in the first level comprises all possible materials that are easily distinguishable and at least one further sub-group in the first level comprises materials that are difficult to distinguish from each other. To each sub-group at least one identification frequency range is associated, and said spectral distances are only determined within said at least one identification frequency range in each relevant sub-group of each level and only with respect to reference spectra of materials being comprised in the relevant sub-group.