The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Aug. 13, 1999
Kazushige Umezawa, Futtsu, JP;
Tokio Suzuki, Kawasaki, JP;
Koichi Chiba, Kawasaki, JP;
Ryuji Uemori, Futtsu, JP;
Takehiko Toh, Futtsu, JP;
Hiroyuki Kondo, Kawasaki, JP;
Katsuhiro Fuchigami, Oita, JP;
Eiichi Takeuchi, Futtsu, JP;
Masamitsu Wakoh, Oita, JP;
Akihiro Ono, Kawasaki, JP;
Nippon Steel Corporation, Tokyo, JP;
Abstract
In order to quickly and economically evaluate cleanliness of a metal with high representativity when quantities, compositions, etc., of non-metallic inclusion particles existing in a metal and resulting in product defects are evaluated by a sample collected during the production process of the metal, the present invention provides an evaluation method involving the steps of levitation-melting a metal piece for a predetermined time by cold crucible levitation-melting means, discharging non-metallic inclusion particles contained in the metal piece to the surface of a molten metal, and directly analyzing a curved and non-smooth sample surface after solidification by a fluorescent X-ray analysis method using an energy dispersion type spectroscope, or by other chemical or physical measurements, to measure or analyze the quantities of elements constituting the non-metallic inclusion particles and to determine quantity of the non-metallic inclusions.