The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2003

Filed:

Oct. 15, 2001
Applicant:
Inventors:

Victor C. Wong, Rochester, NY (US);

Badhri Narayan, Rochester, NY (US);

William M. Barnick, Fairport, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/9393 ; B41J 2/938 ;
U.S. Cl.
CPC ...
B41J 2/9393 ; B41J 2/938 ;
Abstract

An improvement for non-uniformity correction in a printing apparatus ( ) wherein an image forming assembly ( ) forms an image using a plurality of exposure elements, and the amount of exposure energy at each individual exposure element is capable of being varied. A test print ( ) is generated, having a series of test patches or zones with predetermined density levels. A scanner ( ) scans the test print ( ) to obtain density value readings within each test density zone ( ) for each pixel that corresponds to each exposure element. Density value readings are averaged. Then, difference in measurement from this average is used to compute a correction factor for each individual exposure element. An image data manager ( ) conditions the input data by this correction factor, then sends the conditioned image data to the image forming assembly ( ) for printing.


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