The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Dec. 04, 2001
Applicant:
Inventor:
Michael N. Tranquilla, Livonia, MI (US);
Assignee:
Unisys Corporation, Blue Bell, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 7/02 ;
U.S. Cl.
CPC ...
B65H 7/02 ;
Abstract
A method of document overlap/gap error detection and correction includes detecting a trailing edge of a first document at a feeder, and detecting a leading edge of a second document at an edge detector between the feeder and a transport stage. An overlap/gap error is determined and the feeder is controlled to correct the overlap/gap error, when the error is present. An overlap may be measured before the first document trailing edge arrives at the edge detector, providing a greater remaining length of the second document left in the feeder with which to perform the necessary feeder motions to correct the overlap/gap error.