The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2003

Filed:

Apr. 26, 2001
Applicant:
Inventors:

Dillon F. Scofield, Newark, DE (US);

Vitaly V. Romanenko, St. Petersburg, 195252, RU;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/502 ;
U.S. Cl.
CPC ...
G01N 1/502 ;
Abstract

An apparatus and method for determining the particle size distribution of a plurality of particles in a sample, the apparatus comprising a particle charging chamber for charging the particles in proportion to a dimension of the particle, such as surface area, and from which charged particles exit primarily one-at-a-time, a collector electrode for catching the exiting particles, and a charge-measuring device that produces an output with a value representing the measured particle charge. The particle charging chamber may comprise a number of electrodes and a DC voltage source connected to the electrodes. A conversion device, such as a computer, may receive the output from the charge-measuring device and convert measured individual particle charge data to a particle surface area distribution. The apparatus may further comprise light beams and light detecting means between the exit of the charging chamber and the collector electrode, for determining particle terminal velocity as it exits the charging chamber. A method for measuring particle size using the apparatus described herein is also disclosed.


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