The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2003

Filed:

Aug. 27, 2001
Applicant:
Inventor:

Bijan K. Amini, Houston, TX (US);

Assignee:

Em-Tech LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/904 ;
U.S. Cl.
CPC ...
G01N 2/904 ;
Abstract

The present invention relates to a method and apparatus for detecting anomalies, defects or electromagnetic properties of electrically conductive and magnetically permeable materials by using a magnet to partially saturate the material, thereby lowering its permeability, and sending a second, higher frequency oscillating electromagnetic wave into the material. The oscillating magnetic flux field permeating into the electrically conductive material induces eddy waves. As the apparatus passes over the material, the properties of the induced eddy currents, and the corresponding magnetic flux field induced by such eddy currents, changes as the properties of the material change. These changes can be the result of defects or anomalies in the material or in connecting welds.


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