The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2003

Filed:

Nov. 15, 2000
Applicant:
Inventors:

Keerthinarayan P. Heragu, Irving, TX (US);

Patrick W. Bosshart, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A method for generating charge sharing test vectors for a circuit generates a first test vector ( ) and a second test vector ( ). The method provides a test model ( ) including a logic cell ( ) and an auxiliary test circuit ( ) where the auxiliary test circuit ( ) includes a discharge AND gate ( ) and a charge sharing AND gate ( ). The method generates a first test vector ( ) for the test model ( ) having an input pattern to discharge nodes of the logic cell ( ) and evaluate discharge AND gate ( ) to a logic level 1. The method generates a second test vector ( ) having an input pattern to evoke the worst charge sharing behavior for the logic cell ( ) and evaluate charge sharing AND gate ( ) to a logic level 1.


Find Patent Forward Citations

Heragu, Keerthinarayan. (2003). Method and system for generating charge sharing test vectors (U.S. Patent No. 6553547). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6553547

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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