The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2003
Filed:
Feb. 05, 1999
Masayuki Demura, Ebina, JP;
Hironobu Nagura, Yokohama, JP;
Tetsuya Tamura, Yamato, JP;
Keisuke Tanaka, Yokohama, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for detecting and correcting errors and erasures in product-coded data arrays by iterative syndrome processing array data in row major order and column major order. A first dense map is formed for classifying each row containing location indicia of random errors, their correction patterns, and pointers to rows containing erasure errors. This map is used to effectuate row array random error corrections in place in memory. A second dense map is formed of location indicia and correction patterns for each pair adjacent position within a column containing erasure errors as indexed by a counterpart row pointer. The second map is used to effectuate column array erasure corrections and random error corrections in place in memory.