The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2003

Filed:

Oct. 28, 1999
Applicant:
Inventor:

Tatsunori Komoike, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
Abstract

In a test circuit for a semiconductor integrated circuit, a counter circuit generates a control signal based on a comparison result between test results and expected data from a comparison circuit and outputs the control signal to a tri state buffer. The tri state buffer operates based on the received control signal. The counter circuit outputs the generated control signal to the tri state buffer in order that the tri state buffer outputs the test result to the outside of the test circuit only when the test results are not equal to the expected data.


Find Patent Forward Citations

Komoike, Tatsunori. (2003). Test circuit for semiconductor integrated circuit (U.S. Patent No. 6553528). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6553528

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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