The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2003
Filed:
Apr. 07, 2000
Applicant:
Inventors:
Stefan R. Kirsch, Lauchringen, DE;
Christian J. Schilling, Wuerenlingen, CH;
Assignee:
Northern Digital Inc., Waterloo, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 ; G01B 7/14 ;
U.S. Cl.
CPC ...
A61B 5/05 ; G01B 7/14 ;
Abstract
A process detects distortions to magnetic location or orientation determinations. The process includes measuring a plurality of magnetic field values, determining one of a probe's location and a probe's orientation from an extremum of an optimization function. The measured values depend on the probe's location and orientation. The optimization function depends on the measured field values and field values calculated from a model. The process also includes indicating that a distortion to the determining exists in response to the extremum belonging to a preselected range.