The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2003
Filed:
Jul. 17, 2001
Andreas Langmeier, München, DE;
Winfried Lohmiller, München, DE;
Eads Deutschland GmbH, Munich, DE;
Abstract
A method for implementation in a measuring system containing a sensor system and an arithmetic unit for detection of a defect in the measuring system, wherein at least one state variable of the system is derived from at least one sensor value in the measuring system, wherein a cost function value based on deviation of the measured value y from the calibration as a function of a previously calculated state x is calculated for the respective measurement and the calculated squared deviation is then compared with a corresponding threshold value. An error is identified and if necessary appropriate action is taken if the threshold value is exceeded.