The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2003
Filed:
Jun. 01, 1999
Applicant:
Inventor:
Chingwei Chang, Vancouver, WA (US);
Assignee:
Sharp Laboratories of America, Inc., Camas, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/40 ;
U.S. Cl.
CPC ...
H04N 1/40 ;
Abstract
A method for enhanced error diffusion. The method includes the steps of selecting values for a first level of peak positions, placing these peak positions in selected positions of a matrix, creating a peak position profile. The peak position profiles are then used to adjust the error threshold by applying the peak position profile. The profiled error threshold is then used to calculate error for the current input pixel value and the resulting error is diffused to the neighbors of the current pixel.