The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2003
Filed:
Feb. 27, 2001
Applicant:
Inventor:
Joerg Bewersdorf, Heidelberg, DE;
Assignee:
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/100 ;
Abstract
A method and an apparatus for illuminating a transparent specimen ( ), in particular for use in double confocal scanning microscopy, wherein for illumination of a point of the specimen ( ), two light waves of a coherent light source ( ) focused from opposite directions ( ) onto the point interfere to form an illumination pattern, and in order to eliminate the causes of the problems of the reconstruction method, at least two additional coherent light waves traveling toward one another are superimposed in order to minimize the secondary maxima ( ) of the illumination pattern.