The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2003

Filed:

May. 07, 2001
Applicant:
Inventor:

Arno Nauerth, Erlenbach, DE;

Assignee:

Bruker Biospin MRI GmbH, Ettlingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A method of correcting disturbing influences on MR (=magnetic resonance) signals of a substance disposed in the measuring volume of an MR apparatus excited by one or more RF (=radio frequency) excitation pulses, wherein an RF excitation pulse is irradiated onto the substance and a time-dependent MR signal generated thereby is detected and digitized in a phase-sensitive fashion, wherein a time dependence ( )&Dgr;&phgr; (t ) of the phase of an MR signal, relative to a predetermined reference phase &phgr; (t ) of a reference signal S (t ), is determined and digitized from a time dependence ( ) s (t ) of the detected and digitized MR signal and one or more correction or controlled variables are determined therefrom. Nearly all measuring points are used for determination of the magnetic field deviation and thus for control to guarantee considerably improved control accuracy.


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