The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6552536 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 22, 2003

Filed:

Jun. 17, 2002
Applicant:
Inventor:

Richard L. Trantow, Cincinnati, OH (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/314 ; G01R 3/500 ; G01N 2/784 ; B32B 1/504 ; B32B 9/04 ;
U.S. Cl.
CPC ...
G01R 3/314 ; G01R 3/500 ; G01N 2/784 ; B32B 1/504 ; B32B 9/04 ;
Abstract

A reference standard and method for inspecting dual-layered coatings. The reference standard has a first layer adherent to a substrate, the first layer has a predetermined thickness that increases in one direction. Adherent to the first layer is a second layer, the second layer has a predetermined thickness that increases in a direction orthogonal with the first layer. The orientation of the first and second layers of the reference standard provides a spectrum of the possible variations of the dual-layered coating.


Find Patent Forward Citations

Trantow, Richard. (2003). Reference standard for inspection of dual-layered coatings (U.S. Patent No. 6552536). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6552536

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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